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VLSI 2010 Annual Symposium
by Voros, Nikolaos.
Publication:
. X, 346 p.
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Design, Analysis and Test of Logic Circuits Under Uncertainty
by Krishnaswamy, Smita.
Publication:
. XI, 123 p. 71 illus.
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Models in Hardware Testing
by Wunderlich, Hans-Joachim.
Publication:
. XIV, 257 p.
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Trustworthy Internet
by Salgarelli, Luca.
Publication:
. XVIII, 369p. 84 illus.
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Fault-Tolerant Design
by Dubrova, Elena.
Publication:
. XV, 185 p. 84 illus.
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Predictive Technology Model for Robust Nanoelectronic Design
by Cao, Yu.
Publication:
. XV, 173 p.
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Test and Diagnosis for Small-Delay Defects
by Tehranipoor, Mohammad.
Publication:
. XVI, 212p. 114 illus.
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Soft Errors in Modern Electronic Systems
by Nicolaidis, Michael.
Publication:
. XVIII, 318 p.
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Dependability of Networked Computer-based Systems
by Verma, Ajit Kumar.
Publication:
. XVIII, 202 p.
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Software Reliability Assessment with OR Applications
by Kapur, P.K.
Publication:
. XXIV, 548 p.
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Energy Minimization Methods in Computer Vision and Pattern Recognition
by Heyden, Anders.
Publication:
. XII, 363 p. 130 illus.
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Parallel Computing Technologies
by Malyshkin, Victor.
Publication:
. XVI, 444 p. 183 illus.
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Supercomputing
by Kunkel, Julian Martin.
Publication:
. XII, 477 p. 210 illus.
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Distributed Applications and Interoperable Systems
by Göschka, Karl Michael.
Publication:
. XII, 240p. 71 illus.
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Parallel Computing Technologies
by Malyshkin, Victor.
Publication:
. XIV, 500p.
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Energy Minimization Methods in Computer Vision and Pattern Recognition
by Boykov, Yuri.
Publication:
. Approx. 450 p.
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Critical Information Infrastructures Security
by Xenakis, Christos.
Publication:
. X, 161p.
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Distributed Applications and Interoperable Systems
by Felber, Pascal.
Publication:
. XII, 304 p.
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Euro-Par 2010 - Parallel Processing
by D’Ambra, Pasqua.
Publication:
. XXV, 544p. 222 illus.
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Euro-Par 2010 - Parallel Processing
by D’Ambra, Pasqua.
Publication:
. XXX, 600 p. 264 illus.
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